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DTSTART:19700329T010000
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SUMMARY:Advances in Traceable Micro & Nanoscale Engineering Metrology
DESCRIPTION:A Physics and Engineering Seminar by Professor Richard Leach from The National Physical Laboratory.\n\nIt is now fully appreciated that metrology will play an integral role in the successful development and commercialisation of micro- and nanotechnology. To this end the UK Government, through the National Measurement System, funded several groundbreaking projects in its 2005-2008 Programme for Engineering Measurement.\n\nThis review will briefly describe the background of the research, concentrating on the technical details of the projects.\n\nProjects include the development of traceable instrumentation to measure thin films, areal surface texture, very low forces and micro-scale geometry.\n\nLight refreshments will be available from 1030 in The Masters Training Suite.
DTSTART:20080819T110000
DTEND:20080819T120000
LOCATION:Seminar Room 2, Masters Training Suite
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